Electrical Performance Test System

The electrical performance testing of power semiconductors mainly covers dynamic and static testing of the devices. Kewell has launched electrical performance testing systems targeting IGBT and SiC MOS modules.

· High testing efficiency, UPH up to 500Pcs in conventional half-bridge module testing.
· Low stray inductance, system stray inductance smaller than 20nH.
· Flexible configuration, test probes can be selected based on DUT or testing requirements.
· Support QG and NTC testing.
· Optional functions: ICES&VTH testing.

· High testing efficiency, UPH up to 1500Pcs in conventional half-bridge module testing.
· Modular design, standalone board for power supply and channel switching, easy to replace and maintain.
· Highly compatible, support IGBT and SiC MOS testing, as well as SiC test standards and various topology testing.
· Long service life of relays, also support calculation of lifespan.
· Excitation source readback, all given voltage and current excitation can be read back.
· In lab mode, the waveforms of each test item are displayed on the software interface.