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Position:Home  >  Product Center  >  Power Semiconductor Test System  >  Performance Test System  >  MX700-D SiC Dynamic Test System
MX700-D SiC Dynamic Test System


The MX700D silicon carbide dynamic test system comprises a high-precision programmable DC power supply, fixture unit, measurement and control unit, gate drive unit, protection unit, and supporting test instruments. It incorporates the company's self-developed testing software, providing a stable and precise platform for testing the dynamic characteristics of silicon carbide devices.


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    • The system offers a comprehensive range of testing capabilities, supporting single-pulse, double-pulse, short-circuit, and gate charge tests.
    • It features over-current protection, which rapidly shuts down the current circuit when device failure occurs.
    • The system achieves extremely low stray inductance in the test loop through sophisticated design, meeting the requirements for SiC device characterization.
    • The system delivers exceptional compatibility, enabling testing across various packaging formats and circuit configurations by adapting to different test fixtures.
    • The system incorporates multiple independent drive units to ensure testing consistency.
    • The system features an intuitive human-machine interface designed for straightforward and convenient operation.