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Position:Home  >  Product Center  >  Power Semiconductor Test System  >  Performance Test System  >  MX300D IGBT Dynamic Test System
MX300D IGBT Dynamic Test System
IGBT Dynamic Test System is composed of high precision programmable DC power supply, fixture unit, sampling & control unit, drive unit, protection unit, and supporting measuring instruments. With software independently developed by Kewell,the system provides a stable and precise platform to test the dynamic characteristics of IGBT.

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    • Versatile test functions: single pulse test, double pulse test, and short-circuit test.
    • Process capability of low stray inductance.
    • Overcurrent protection and quick current-off capability.
    • High measurement accuracy.
    • Wide voltage output and multi-grade inductive load. Satisfy the diverse requirements of dynamic testing.
    • Real-time monitoring function, and data logging & analysis functions.
    • Test work-step and protection variables can be adjust online.