MX300C Semiconductor Thermal Characteristics Test System

Product Introduction

MX300C series is an automated thermal characteristics test system for power semiconductor. It consists of sampling unit, temperature control unit, power supply unit and system control unit. It is mainly suitable for power cycling test and thermal resistance test of power semiconductor such as IGBT(Si/SiC/GaN materials), MOSFET, DIODE, and etc., to evaluate the performance of power semiconductor during service life.

Functions

• Power cycling test

• Thermal resistance test/Transient thermal resistance test (Rth/Zth)

• The K Curve test

• Junction-to-case thermal resistance (RJC)

• Gate leakage current test (IGES)