You are here: Home » Products Center » Power Semiconductor & Intelligent Manufacturing Equipment » MX300D Series IGBT Dynamic Test System » MX300D Series IGBT Dynamic Test System

MX300D Series IGBT Dynamic Test System

.Turn-on test (Pon, Eon)
.Turn-off test (Poff, Eoff)
.Reverse recovery characteristics of diode

Availability:


Inquire

Model: MX300D

Summary

MX300D IGBT Dynamic Test System is composed of high precision programmable DC power supply, fixture unit, measurement control unit, drive control unit, protection unit, and supporting test instruments. With software independently developed by Kewell, the system provides a stable and precise platform to test the dynamic characteristics of IGBT.

Functions

Turn-on test (Pon, Eon)
Turn-off test (Poff, Eoff)
Reverse recovery properties of diode
Short-circuit characteristics
Gate-charge QG test

Advantages

Versatile test functions: single pulse test, double pulse test, gate-charge detection and short-circuit test
High reliability. Over-current protection.
Low stray inductance
High measurement accuracy
Integration of hardware and software. Complete safety protection.
Wide voltage output. Multiple inductive load gears. Satisfy the diverse requirements of dynamic testing.
Powerful monitoring software. Standardized operation and real-time monitoring. Work steps and protection variables can be set online. Simple and convenient. Well-established data recording system and analytics for future processing.

MX300D IGBT Dynamic Test System

Model		MX300D-1500-3000
Output	Voltage range	0-1500V
	Voltage precision	0.1%FS
	Voltage resolution	0.1V
	Voltage measurement	. LeCroy oscilloscope (Resolution: 12 bit, 4-channel; Band width: 350MHz; Sampling rate: 2.5GS/s) . YOKOGAWA 701977 differential voltage probe (Band width: 50MHz; Peak voltage: 7000V
	Rated current	10~3000A
	Current precision	±10%rdg
	Current resolution	1A
	Current measurement	. LeCroy oscilloscope (Resolution: 12 bit, 4-channel; Band width: 350MHz; Sampling rate: 2.5GS/s) . CWT MINI 30B Rogowski coils
Parameters	Work mode	Laboratory mode/Production mode
	Positive & negative gate voltages	0.5~30V
	Gate voltage precision	2%FS
	Gate voltage resolution	0.1V
	Inductor load	20µH; 50µH; 100µH; 200µH; 500µH; 1000µH; 2000µH
	Substrate temp. range	25~200℃
	Substrate temp. precision	0.5%FS
	Substrate temp. resolution	0.1℃
Reserved Interface	Fixture (adapter)	Customize according to IGBT models.
	External load	Can be connected to user-selected devices
	Gate resistance	Can be connected to user-selected devices
	Gate capacitance	Can be connected to user-selected devices
	Gate clamp	Can be connected to user-selected devices
	Collector clamp	Can be connected to user-selected devices
Protection	Overcurrent	Overcurrent protection point is editable. Fast protection activation.
	Input	OVP/OCP/Over-load/Under-voltage/Phase loss etc.
	Output	OVP/OTP/OCP etc.
Specifications	Protection level	IP21 (indoor)
	Dimensions	805mm (D) × 1400mm (W) ×1915mm (H)
	Ambient Temperature	25℃±10℃

Model		MX300D-1500-3000
Output	Voltage range	0-1500V
	Voltage precision	0.1%FS
	Voltage resolution	0.1V
	Voltage measurement	. LeCroy oscilloscope (Resolution: 12 bit, 4-channel; Band width: 350MHz; Sampling rate: 2.5GS/s) . YOKOGAWA 701977 differential voltage probe (Band width: 50MHz; Peak voltage: 7000V
	Rated current	10~3000A
	Current precision	±10%rdg
	Current resolution	1A
	Current measurement	. LeCroy oscilloscope (Resolution: 12 bit, 4-channel; Band width: 350MHz; Sampling rate: 2.5GS/s) . CWT MINI 30B Rogowski coils
Parameters	Work mode	Laboratory mode/Production mode
	Positive & negative gate voltages	0.5~30V
	Gate voltage precision	2%FS
	Gate voltage resolution	0.1V
	Inductor load	20µH; 50µH; 100µH; 200µH; 500µH; 1000µH; 2000µH
	Substrate temp. range	25~200℃
	Substrate temp. precision	0.5%FS
	Substrate temp. resolution	0.1℃
Reserved Interface	Fixture (adapter)	Customize according to IGBT models.
	External load	Can be connected to user-selected devices
	Gate resistance	Can be connected to user-selected devices
	Gate capacitance	Can be connected to user-selected devices
	Gate clamp	Can be connected to user-selected devices
	Collector clamp	Can be connected to user-selected devices
Protection	Overcurrent	Overcurrent protection point is editable. Fast protection activation.
	Input	OVP/OCP/Over-load/Under-voltage/Phase loss etc.
	Output	OVP/OTP/OCP etc.
Specifications	Protection level	IP21 (indoor)
	Dimensions	805mm (D) × 1400mm (W) ×1915mm (H)
	Ambient Temperature	25℃±10℃

MX300D Series IGBT Dynamic Test System

FOLLOW US

QUICK ACCESS