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MX300D Series IGBT Dynamic Test System

 
.Turn-on test (Pon, Eon)
.Turn-off test (Poff, Eoff)
.Reverse recovery characteristics of diode
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  • MX300D


Summary


MX300D IGBT Dynamic Test System is composed of high precision programmable DC power supply, fixture unit, measurement control unit, drive control unit, protection unit, and supporting test instruments. With software independently developed by Kewell, the system provides a stable and precise platform to test the dynamic characteristics of IGBT.

Functions


  • Turn-on test (Pon, Eon)

  • Turn-off test (Poff, Eoff)

  • Reverse recovery properties of diode

  • Short-circuit characteristics

  • Gate-charge QG test


Advantages


  • Versatile test functions: single pulse test, double pulse test, gate-charge detection and short-circuit test

  • High reliability. Over-current protection.

  • Low stray inductance

  • High measurement accuracy

  • Integration of hardware and software. Complete safety protection.

  • Wide voltage output. Multiple inductive load gears. Satisfy the diverse requirements of dynamic testing.

  • Powerful monitoring software. Standardized operation and real-time monitoring. Work steps and protection variables can be set online. Simple and convenient. Well-established data recording system and analytics for future processing.


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Models & Specifications


Model

MX300D-1500-3000

Output

Voltage range

0-1500V

Voltage precision

0.1%FS

Voltage resolution

0.1V

Voltage measurement

. LeCroy oscilloscope (Resolution: 12 bit, 4-channel; Band width: 350MHz; Sampling rate: 2.5GS/s)

. YOKOGAWA 701977 differential voltage probe (Band width: 50MHz; Peak voltage: 7000V

Rated current

10~3000A

Current precision

±10%rdg

Current resolution

1A

Current measurement

. LeCroy oscilloscope (Resolution: 12 bit, 4-channel; Band width: 350MHz; Sampling rate: 2.5GS/s)

. CWT MINI 30B Rogowski coils

Parameters

Work mode

Laboratory mode/Production mode

Positive & negative gate voltages

0.5~30V

Gate voltage precision

2%FS

Gate voltage resolution

0.1V

Inductor load

20µH; 50µH; 100µH; 200µH; 500µH; 1000µH; 2000µH

Substrate temp. range

25~200℃

Substrate temp. precision

0.5%FS

Substrate temp. resolution

0.1℃

Reserved Interface

Fixture (adapter)

Customize according to IGBT models.

External load

Can be connected to user-selected devices

Gate resistance

Can be connected to user-selected devices

Gate capacitance

Can be connected to user-selected devices

Gate clamp

Can be connected to user-selected devices

Collector clamp

Can be connected to user-selected devices

Protection

Overcurrent

Overcurrent protection point is editable.

Fast protection activation.

Input

OVP/OCP/Over-load/Under-voltage/Phase loss etc.

Output

OVP/OTP/OCP etc.

Specifications

Protection level

IP21 (indoor)

Dimensions

805mm (D) × 1400mm (W) ×1915mm (H)

Ambient Temperature

25℃±10℃

*The information above is only valid for independent test equipment.

*The system is also available with production line testing solution.

*With Rogowski coils, the stray inductance of system loop reaches under 40nH, without considering the stray inductance of modules and fixtures; Pearson sensor is available as well, but the stray inductance may be higher than that of Rogowski coils.


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MX300D IGBT Dynamic Test System
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