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MX300C Series Semiconductor Thermal Characteristics Test System

 
. Power cycling test
. Thermal resistance test/Transient thermal resistance test (Rth/Zth)
. The K Curve test
  • MX300C


Summary


MX300C Series is an automated thermal characteristics test system for power devices, composed of sampling units, temperature control units, power supply units, and control units. It is mainly applied in the power cycling and thermal characteristics tests of IGBT, simulating and measuring the performance of power devices during their service life.

Functions


  • Power cycling test

  • Thermal resistance test/Transient thermal resistance test (Rth/Zth)

  • The K Curve test

  • Junction-to-case thermal resistance (RJC)

  • Gate leakage current test (IGES) 



Advantages


  • High precision test and control over constant temperature plate. Fast removal of IH.

  • “Real-time” diagnosis of structure and functions: Fast access to fault progress, cycle-index, and cause. Automatic shutdown.

  • Support remote control during operation: Mobile/PC

  • Complete protection mechanism: Overtemperature/smoke/coolant leakage detection

  • Compatibility: IGBT/DIODE/MOSFET/BJT/SCR tests.

  • Adopt UPS power supply allowing the auxiliary control system to indicate safety status of the equipment under power off condition


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Models & Specifications

Models

MX300C-1500

Precision

Constant temp. plate 1

Temp. control precision: ±0.5℃

Temp. control range: 15~80℃

Constant temp. plate 2

Stability: ±0.01℃

Temp. control range: -35~200℃

Voltage drop measurement

±50μV

Tj measurement

±2℃

Temp. measurement of cold plate & case

±2℃

Gate current detection

0.2nA-100uA; Resolution: 25pA

Capacity

Rth/Zth/K Curve

1 sample per single test

Power cycling

(Unit: Second/Minute)

12 samples per single test

The K Curve Test

Test current

Range: 0~3A; Precision: ≤0.1%+5mA; Resolution: 0.1mA

Constant temp. system

Temp. range: -35~200℃; Stability: ±0.01℃

(Depend on the equipment.)

Rth/Zth Test

Tj test

Sampling rate: 1MHz; Precision: 2℃; Resolution: 0.1℃

Tc test

Sampling rate: 1MHz; Precision: 2℃; Resolution: 0.1℃

Fast turnoff

Sample Im can be removed within 1μs.

Zthjc/Zthja tests

Available

Display of integral/differential structure function curve

Available

Power Cycling Test

(Unit: Second)

Power supply

Output capacity>1800A;

Current precision: ±0.1%set+0.4%FS

Tj test

Sampling rate: 10KHz; Precision: 2℃; Resolution: 0.1℃

Tc test

Sampling rate: 10KHz; Precision: 2℃; Resolution: 0.1℃

Typical conditions

0.5s<tcycle<10s; Tjmax=150℃; ΔTjmax=60K;

130,000 cycles

Ageing mode

Constant current; Constant Tjmax/ΔTjmax;

Constant power P

Data recording

IH; ton; toff; Tjmax; ΔTj; Tjmin; Tcoolant; Coolant flow F; Cold plate temp. THS

Power Cycling Test

(Unit: Minute)

Power supply

Output capacity>1800A/10V

Current precision: ±0.1%set+0.4%FS

Tj test

Sampling rate: 10KHz; Precision: 2℃; Resolution: 0.1℃

Tc test

Sampling rate: 10KHz; Precision: 2℃; Resolution: 0.1℃

Typical conditions

2min<tcycle<6min; TCmin=25℃; ΔTjmax=80K; 2,000~5,000 cycles

Ageing mode

Constant current; Constant Tjmax/ΔTjmax; Constant power P

Data recording

IH; ton; toff; Tjmax; ΔTj; Tjmin; Tcoolant; Coolant flow F; Cold plate temp. THS


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