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MX300C Series Semiconductor Thermal Characteristics Test System

. Power cycling test
. Thermal resistance test/Transient thermal resistance test (Rth/Zth)
. The K Curve test


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Model: MX300C

Summary

MX300C Series is an automated thermal characteristics test system for power devices, composed of sampling units, temperature control units, power supply units, and control units. It is mainly applied in the power cycling and thermal characteristics tests of IGBT, simulating and measuring the performance of power devices during their service life.

Functions

Power cycling test
Thermal resistance test/Transient thermal resistance test (Rth/Zth)
The K Curve test
Junction-to-case thermal resistance (RJC)
Gate leakage current test (IGES)

Advantages

High precision test and control over constant temperature plate. Fast removal of IH.
“Real-time” diagnosis of structure and functions: Fast access to fault progress, cycle-index, and cause. Automatic shutdown.
Support remote control during operation: Mobile/PC
Complete protection mechanism: Overtemperature/smoke/coolant leakage detection
Compatibility: IGBT/DIODE/MOSFET/BJT/SCR tests.
Adopt UPS power supply allowing the auxiliary control system to indicate safety status of the equipment under power off condition

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MX300C Semiconductor Thermal Characteristics Test System

Models		MX300C-1500
Precision	Constant temp. plate 1	Temp. control precision: ±0.5℃ Temp. control range: 15~80℃
	Constant temp. plate 2	Stability: ±0.01℃ Temp. control range: -35~200℃
	Voltage drop measurement	±50μV
	Tj measurement	±2℃
	Temp. measurement of cold plate & case	±2℃
	Gate current detection	0.2nA-100uA; Resolution: 25pA
Capacity	Rth/Zth/K Curve	1 sample per single test
Capacity	Power cycling (Unit: Second/Minute)	12 samples per single test
The K Curve Test	Test current	Range: 0~3A; Precision: ≤0.1%+5mA; Resolution: 0.1mA
The K Curve Test	Constant temp. system	Temp. range: -35~200℃; Stability: ±0.01℃ (Depend on the equipment.)
Rth/Zth Test	Tj test	Sampling rate: 1MHz; Precision: 2℃; Resolution: 0.1℃
	Tc test	Sampling rate: 1MHz; Precision: 2℃; Resolution: 0.1℃
	Fast turnoff	Sample Im can be removed within 1μs.
	Zthjc/Zthja tests	Available
	Display of integral/differential structure function curve	Available
Power Cycling Test (Unit: Second)	Power supply	Output capacity>1800A; Current precision: ±0.1%set+0.4%FS
	Tj test	Sampling rate: 10KHz; Precision: 2℃; Resolution: 0.1℃
	Tc test	Sampling rate: 10KHz; Precision: 2℃; Resolution: 0.1℃
	Typical conditions	0.5s<tcycle<10s; Tjmax=150℃; ΔTjmax=60K; 130,000 cycles
	Ageing mode	Constant current; Constant Tjmax/ΔTjmax; Constant power P
	Data recording	IH; ton; toff; Tjmax; ΔTj; Tjmin; Tcoolant; Coolant flow F; Cold plate temp. THS
Power Cycling Test (Unit: Minute)	Power supply	Output capacity>1800A/10V Current precision: ±0.1%set+0.4%FS
	Tj test	Sampling rate: 10KHz; Precision: 2℃; Resolution: 0.1℃
	Tc test	Sampling rate: 10KHz; Precision: 2℃; Resolution: 0.1℃
	Typical conditions	2min<tcycle<6min; TCmin=25℃; ΔTjmax=80K; 2,000~5,000 cycles
	Ageing mode	Constant current; Constant Tjmax/ΔTjmax; Constant power P
	Data recording	I_H; ton; toff; Tjmax; ΔTj; Tjmin; Tcoolant; Coolant flow F; Cold plate temp. THS

Models		MX300C-1500
Precision	Constant temp. plate 1	Temp. control precision: ±0.5℃ Temp. control range: 15~80℃
	Constant temp. plate 2	Stability: ±0.01℃ Temp. control range: -35~200℃
	Voltage drop measurement	±50μV
	Tj measurement	±2℃
	Temp. measurement of cold plate & case	±2℃
	Gate current detection	0.2nA-100uA; Resolution: 25pA
Capacity	Rth/Zth/K Curve	1 sample per single test
Capacity	Power cycling (Unit: Second/Minute)	12 samples per single test
The K Curve Test	Test current	Range: 0~3A; Precision: ≤0.1%+5mA; Resolution: 0.1mA
The K Curve Test	Constant temp. system	Temp. range: -35~200℃; Stability: ±0.01℃ (Depend on the equipment.)
Rth/Zth Test	Tj test	Sampling rate: 1MHz; Precision: 2℃; Resolution: 0.1℃
	Tc test	Sampling rate: 1MHz; Precision: 2℃; Resolution: 0.1℃
	Fast turnoff	Sample Im can be removed within 1μs.
	Zthjc/Zthja tests	Available
	Display of integral/differential structure function curve	Available
Power Cycling Test (Unit: Second)	Power supply	Output capacity>1800A; Current precision: ±0.1%set+0.4%FS
	Tj test	Sampling rate: 10KHz; Precision: 2℃; Resolution: 0.1℃
	Tc test	Sampling rate: 10KHz; Precision: 2℃; Resolution: 0.1℃
	Typical conditions	0.5s<tcycle<10s; Tjmax=150℃; ΔTjmax=60K; 130,000 cycles
	Ageing mode	Constant current; Constant Tjmax/ΔTjmax; Constant power P
	Data recording	IH; ton; toff; Tjmax; ΔTj; Tjmin; Tcoolant; Coolant flow F; Cold plate temp. THS
Power Cycling Test (Unit: Minute)	Power supply	Output capacity>1800A/10V Current precision: ±0.1%set+0.4%FS
	Tj test	Sampling rate: 10KHz; Precision: 2℃; Resolution: 0.1℃
	Tc test	Sampling rate: 10KHz; Precision: 2℃; Resolution: 0.1℃
	Typical conditions	2min<tcycle<6min; TCmin=25℃; ΔTjmax=80K; 2,000~5,000 cycles
	Ageing mode	Constant current; Constant Tjmax/ΔTjmax; Constant power P
	Data recording	I_H; ton; toff; Tjmax; ΔTj; Tjmin; Tcoolant; Coolant flow F; Cold plate temp. THS

MX300C Series Semiconductor Thermal Characteristics Test System

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