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Summary MX300C Series is an automated thermal characteristics test system for power devices, composed of sampling units, temperature control units, power supply units, and control units. It is mainly applied in the power cycling and thermal characteristics tests of IGBT, simulating and measuring the performance of power devices during their service life. | Functions
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Advantages
High precision test and control over constant temperature plate. Fast removal of IH.
“Real-time” diagnosis of structure and functions: Fast access to fault progress, cycle-index, and cause. Automatic shutdown.
Support remote control during operation: Mobile/PC
Complete protection mechanism: Overtemperature/smoke/coolant leakage detection
Compatibility: IGBT/DIODE/MOSFET/BJT/SCR tests.
Adopt UPS power supply allowing the auxiliary control system to indicate safety status of the equipment under power off condition
Summary MX300C Series is an automated thermal characteristics test system for power devices, composed of sampling units, temperature control units, power supply units, and control units. It is mainly applied in the power cycling and thermal characteristics tests of IGBT, simulating and measuring the performance of power devices during their service life. | Functions
|
Advantages
High precision test and control over constant temperature plate. Fast removal of IH.
“Real-time” diagnosis of structure and functions: Fast access to fault progress, cycle-index, and cause. Automatic shutdown.
Support remote control during operation: Mobile/PC
Complete protection mechanism: Overtemperature/smoke/coolant leakage detection
Compatibility: IGBT/DIODE/MOSFET/BJT/SCR tests.
Adopt UPS power supply allowing the auxiliary control system to indicate safety status of the equipment under power off condition
Models & Specifications
Models | MX300C-1500 | |
Precision | Constant temp. plate 1 | Temp. control precision: ±0.5℃ Temp. control range: 15~80℃ |
Constant temp. plate 2 | Stability: ±0.01℃ Temp. control range: -35~200℃ | |
Voltage drop measurement | ±50μV | |
Tj measurement | ±2℃ | |
Temp. measurement of cold plate & case | ±2℃ | |
Gate current detection | 0.2nA-100uA; Resolution: 25pA | |
Capacity | Rth/Zth/K Curve | 1 sample per single test |
Power cycling (Unit: Second/Minute) | 12 samples per single test | |
The K Curve Test | Test current | Range: 0~3A; Precision: ≤0.1%+5mA; Resolution: 0.1mA |
Constant temp. system | Temp. range: -35~200℃; Stability: ±0.01℃ (Depend on the equipment.) | |
Rth/Zth Test | Tj test | Sampling rate: 1MHz; Precision: 2℃; Resolution: 0.1℃ |
Tc test | Sampling rate: 1MHz; Precision: 2℃; Resolution: 0.1℃ | |
Fast turnoff | Sample Im can be removed within 1μs. | |
Zthjc/Zthja tests | Available | |
Display of integral/differential structure function curve | Available | |
Power Cycling Test (Unit: Second) | Power supply | Output capacity>1800A; Current precision: ±0.1%set+0.4%FS |
Tj test | Sampling rate: 10KHz; Precision: 2℃; Resolution: 0.1℃ | |
Tc test | Sampling rate: 10KHz; Precision: 2℃; Resolution: 0.1℃ | |
Typical conditions | 0.5s<tcycle<10s; Tjmax=150℃; ΔTjmax=60K; 130,000 cycles | |
Ageing mode | Constant current; Constant Tjmax/ΔTjmax; Constant power P | |
Data recording | IH; ton; toff; Tjmax; ΔTj; Tjmin; Tcoolant; Coolant flow F; Cold plate temp. THS | |
Power Cycling Test (Unit: Minute) | Power supply | Output capacity>1800A/10V Current precision: ±0.1%set+0.4%FS |
Tj test | Sampling rate: 10KHz; Precision: 2℃; Resolution: 0.1℃ | |
Tc test | Sampling rate: 10KHz; Precision: 2℃; Resolution: 0.1℃ | |
Typical conditions | 2min<tcycle<6min; TCmin=25℃; ΔTjmax=80K; 2,000~5,000 cycles | |
Ageing mode | Constant current; Constant Tjmax/ΔTjmax; Constant power P | |
Data recording | IH; ton; toff; Tjmax; ΔTj; Tjmin; Tcoolant; Coolant flow F; Cold plate temp. THS |
Models & Specifications
Models | MX300C-1500 | |
Precision | Constant temp. plate 1 | Temp. control precision: ±0.5℃ Temp. control range: 15~80℃ |
Constant temp. plate 2 | Stability: ±0.01℃ Temp. control range: -35~200℃ | |
Voltage drop measurement | ±50μV | |
Tj measurement | ±2℃ | |
Temp. measurement of cold plate & case | ±2℃ | |
Gate current detection | 0.2nA-100uA; Resolution: 25pA | |
Capacity | Rth/Zth/K Curve | 1 sample per single test |
Power cycling (Unit: Second/Minute) | 12 samples per single test | |
The K Curve Test | Test current | Range: 0~3A; Precision: ≤0.1%+5mA; Resolution: 0.1mA |
Constant temp. system | Temp. range: -35~200℃; Stability: ±0.01℃ (Depend on the equipment.) | |
Rth/Zth Test | Tj test | Sampling rate: 1MHz; Precision: 2℃; Resolution: 0.1℃ |
Tc test | Sampling rate: 1MHz; Precision: 2℃; Resolution: 0.1℃ | |
Fast turnoff | Sample Im can be removed within 1μs. | |
Zthjc/Zthja tests | Available | |
Display of integral/differential structure function curve | Available | |
Power Cycling Test (Unit: Second) | Power supply | Output capacity>1800A; Current precision: ±0.1%set+0.4%FS |
Tj test | Sampling rate: 10KHz; Precision: 2℃; Resolution: 0.1℃ | |
Tc test | Sampling rate: 10KHz; Precision: 2℃; Resolution: 0.1℃ | |
Typical conditions | 0.5s<tcycle<10s; Tjmax=150℃; ΔTjmax=60K; 130,000 cycles | |
Ageing mode | Constant current; Constant Tjmax/ΔTjmax; Constant power P | |
Data recording | IH; ton; toff; Tjmax; ΔTj; Tjmin; Tcoolant; Coolant flow F; Cold plate temp. THS | |
Power Cycling Test (Unit: Minute) | Power supply | Output capacity>1800A/10V Current precision: ±0.1%set+0.4%FS |
Tj test | Sampling rate: 10KHz; Precision: 2℃; Resolution: 0.1℃ | |
Tc test | Sampling rate: 10KHz; Precision: 2℃; Resolution: 0.1℃ | |
Typical conditions | 2min<tcycle<6min; TCmin=25℃; ΔTjmax=80K; 2,000~5,000 cycles | |
Ageing mode | Constant current; Constant Tjmax/ΔTjmax; Constant power P | |
Data recording | IH; ton; toff; Tjmax; ΔTj; Tjmin; Tcoolant; Coolant flow F; Cold plate temp. THS |